2 article(s) from Beyer, Hannes

Length-extension resonator as a force sensor for high-resolution frequency-modulation atomic force microscopy in air

  • Hannes Beyer,
  • Tino Wagner and
  • Andreas Stemmer

Beilstein J. Nanotechnol. 2016, 7, 432–438, doi:10.3762/bjnano.7.38

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Published 15 Mar 2016

Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

  • Tino Wagner,
  • Hannes Beyer,
  • Patrick Reissner,
  • Philipp Mensch,
  • Heike Riel,
  • Bernd Gotsmann and
  • Andreas Stemmer

Beilstein J. Nanotechnol. 2015, 6, 2193–2206, doi:10.3762/bjnano.6.225

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Published 23 Nov 2015
 
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